271-1 - EDS元素分析システム搭載電界放出形走査電子顕微鏡

日本電子 JSM-7600F

  • 予約状況

    予約できません。 × 空きなし。 
    空きがあります。  ほぼ空いています。 



    住所: 〒560-0043 大阪府豊中市待兼山町1-2
    建屋・棟: 文理融合型研究棟(豊中)
    フロア: 2F 204顕微鏡室
  • 利用料金

    測定・解析 ◆時間料金/時間+ ◆基本料金/試料
    3,564 円(1時間あたり)
    2,037 円(1試料あたり)


    概要・性能: 電界放出型電子銃・セミインレンズタイプである為、高輝度・高分解能観察が可能。

    Field emission type electron gun and semi-in-lens type enables high brightness and high resolution observation.
    Gentle beam mode enables surface observation with extremely low energy (hundreds eV).
    Simultaneous observation and photography of secondary electrons, reflected electrons, concavo-convex images, and composition images using a reductive backscattered electron detector.
    By using a dedicated holder for fixing the TEM grid, it is possible to easily observe samples in the same sampling lot as those used for TEM observation.
    仕様: 二次電子分解能:1.0nm @ 15kV, 1.4nm @ 1kV
    観察可能倍率:x25 ~ x 1M
    加速電圧:0.1kV ~ 30kV

    Secondary electron resolution: 1.0nm @ 15kV, 1.4nm @ 1kV
    Observable magnification: x25 to x 1M
    Acceleration voltage: 0.1kV to 30kV
    Detector: Secondary electron detector, retractive backscattered electron detector, EDS


    When the data obtained by this instrument to submit to an official publications (e.g. journal etc.) , please write an acknowledgement it refer to following examples.
    資料: 謝辞記載例.pdf
    注意事項: ・利用予定の1週間前までに担当者まで連絡をすること。

    ・Contact staff 1 week before the day of use.
    ・Users must undergo training before use.
    ・Users should complete sampling and other preparation beforehand.
    ・When the user want to use both SEM and plasmaetching device (e.g. Living-SEM), please reserve each instrument respectivery by the system.
    ・For other supplies provided in the analysis laboratories, users should pay according to the amount used


    機器番号: 271-1
    機器状態: 利用可能
    カテゴリー: 07.電子顕微鏡、07.電子顕微鏡/SEM
    機器担当者: 伊藤 彰厚、川村 和司、平山 里実、戸所 泰人
    機器部局: 理学研究科